TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_40_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-023-02 | FUSED_ID : 6359364768388673906
  IC_TEMP :  -46.57 | VDDM : 1128.90 | AUX_INT :  -19.28 | CsaBias :   71.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90543e-03 / 2
  ADC_P0  : -1.92785e-02 ± 3.01075e-02
  ADC_P1  : 8.30880e-03 ± 7.08474e-04
  ADC_P2  : -6.08149e-06 ± 3.32299e-06
  CSA_Chi2/NDF : 7.75771e-05 / 2
  CSA_P0  : 5.70719e-02 ± 5.87474e-03
  CSA_P1  : 9.21442e-03 ± 4.42620e-04
  CSA_P2  : -3.64295e-05 ± 6.74057e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 5, 6, 59, 73, 97, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 5, 50, 106, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3148', '1.800', '0.1429', '1.800', '0.0870', '7.000', '0.7073', 1, 1, 1, 1, 1724892009.0664668]
VI_after__Init : ['1.201', '0.3149', '1.800', '0.1427', '1.801', '0.0817', '7.000', '0.7069', 1, 1, 1, 1, 1724892017.867762]
VI_at__the_End : ['1.202', '0.4876', '1.800', '0.1354', '1.800', '0.1089', '7.000', '0.7082', 1, 1, 1, 1, 1724892073.8633873]