TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_12_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-006-13 | FUSED_ID : 6359364768388677741
  IC_TEMP :  -55.34 | VDDM : 1124.80 | AUX_INT :   -7.79 | CsaBias :   84.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20473e-03 / 2
  ADC_P0  : -7.79167e-03 ± 2.35523e-02
  ADC_P1  : 8.48755e-03 ± 5.96810e-04
  ADC_P2  : -5.32545e-06 ± 3.00180e-06
  CSA_Chi2/NDF : 1.36014e-04 / 2
  CSA_P0  : 5.70221e-02 ± 7.77883e-03
  CSA_P1  : 9.61860e-03 ± 5.86079e-04
  CSA_P2  : -4.41901e-05 ± 8.92528e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 11, 25, 34, 41, 51, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2047', '1.800', '0.1373', '1.800', '0.0862', '7.000', '0.7073', 1, 1, 1, 1, 1724893932.9726796]
VI_after__Init : ['1.202', '0.2047', '1.800', '0.1372', '1.800', '0.0804', '7.000', '0.7075', 1, 1, 1, 1, 1724893941.719036]
VI_at__the_End : ['1.201', '0.4811', '1.800', '0.1345', '1.800', '0.1107', '7.000', '0.7083', 1, 1, 1, 1, 1724893999.9065633]