TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_13_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-007-13 | FUSED_ID : 6359364768388677757
  IC_TEMP :  -59.99 | VDDM : 1201.67 | AUX_INT : -770.31 | CsaBias : -558.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.35232e-02 / 2
  ADC_P0  : -7.70307e-01 ± 2.87094e-01
  ADC_P1  : 1.97536e-02 ± 5.59269e-03
  ADC_P2  : -4.53625e-05 ± 2.22099e-05
  CSA_Chi2/NDF : 9.48981e-05 / 2
  CSA_P0  : 5.67619e-02 ± 6.49757e-03
  CSA_P1  : 9.26785e-03 ± 4.89545e-04
  CSA_P2  : -3.84744e-05 ± 7.45519e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 35, 37, 49, 84, 88, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 5, 20, 25, 41, 45, 122, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3033', '1.800', '0.1623', '1.800', '0.0918', '7.000', '0.7076', 1, 1, 1, 1, 1724894029.0133815]
VI_after__Init : ['1.201', '0.3035', '1.800', '0.1620', '1.800', '0.0863', '7.000', '0.7071', 1, 1, 1, 1, 1724894037.949543]
VI_at__the_End : ['1.201', '0.4860', '1.800', '0.1374', '1.800', '0.1093', '7.000', '0.7079', 1, 1, 1, 1, 1724894100.4938421]