TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_23_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-013-13 | FUSED_ID : 6359364768388677853
  IC_TEMP :  -51.69 | VDDM : 1131.45 | AUX_INT :   -7.88 | CsaBias :   76.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21320e-03 / 2
  ADC_P0  : -7.87789e-03 ± 2.36350e-02
  ADC_P1  : 8.49515e-03 ± 5.98905e-04
  ADC_P2  : -5.38495e-06 ± 3.01234e-06
  CSA_Chi2/NDF : 1.05489e-04 / 2
  CSA_P0  : 5.95442e-02 ± 6.85055e-03
  CSA_P1  : 9.76450e-03 ± 5.16140e-04
  CSA_P2  : -4.33572e-05 ± 7.86020e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [44, 60, 68, 79, 80, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [15, 37, 83, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3207', '1.800', '0.1246', '1.800', '0.0913', '7.000', '0.7076', 1, 1, 1, 1, 1724894606.4980898]
VI_after__Init : ['1.201', '0.3208', '1.800', '0.1246', '1.800', '0.0838', '7.000', '0.7069', 1, 1, 1, 1, 1724894615.245478]
VI_at__the_End : ['1.201', '0.4997', '1.800', '0.1377', '1.800', '0.1097', '7.000', '0.7076', 1, 1, 1, 1, 1724894677.72769]