TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_25_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-014-13 | FUSED_ID : 6359364768388677869
  IC_TEMP :  -58.80 | VDDM : 1129.81 | AUX_INT :   -8.50 | CsaBias :   74.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23142e-03 / 2
  ADC_P0  : -8.50143e-03 ± 2.37849e-02
  ADC_P1  : 8.38232e-03 ± 5.86949e-04
  ADC_P2  : -5.58831e-06 ± 2.87840e-06
  CSA_Chi2/NDF : 1.59848e-04 / 2
  CSA_P0  : 5.93189e-02 ± 8.43288e-03
  CSA_P1  : 1.01925e-02 ± 6.35357e-04
  CSA_P2  : -5.31582e-05 ± 9.67573e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [33, 37, 55, 60, 67, 72, 82, 118, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [29, 55, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4326', '1.800', '0.1650', '1.800', '0.0949', '7.000', '0.7067', 1, 1, 1, 1, 1724894702.7427397]
VI_after__Init : ['1.201', '0.4331', '1.800', '0.1651', '1.800', '0.0891', '7.000', '0.7068', 1, 1, 1, 1, 1724894710.9581444]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1368', '1.800', '0.1116', '7.000', '0.7076', 1, 1, 1, 1, 1724894773.432349]