TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_29_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-017-10 | FUSED_ID : 6359364768388677914
  IC_TEMP :  -50.57 | VDDM : 1125.78 | AUX_INT :   -9.02 | CsaBias :   87.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43085e-03 / 2
  ADC_P0  : -9.02431e-03 ± 2.56582e-02
  ADC_P1  : 8.12966e-03 ± 6.13217e-04
  ADC_P2  : -5.21516e-06 ± 2.91601e-06
  CSA_Chi2/NDF : 9.28234e-05 / 2
  CSA_P0  : 5.89546e-02 ± 6.42615e-03
  CSA_P1  : 9.40205e-03 ± 4.84164e-04
  CSA_P2  : -4.04077e-05 ± 7.37325e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [28, 57, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 40, 52, 65, 117, 123, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3257', '1.800', '0.1282', '1.800', '0.0912', '7.000', '0.7081', 1, 1, 1, 1, 1724894990.9837747]
VI_after__Init : ['1.201', '0.3257', '1.800', '0.1283', '1.800', '0.0828', '7.000', '0.7069', 1, 1, 1, 1, 1724894999.8980753]
VI_at__the_End : ['1.201', '0.4877', '1.800', '0.1377', '1.800', '0.1091', '7.000', '0.7079', 1, 1, 1, 1, 1724895060.7962844]