TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_33_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-019-10 | FUSED_ID : 6359364768388677946
  IC_TEMP :  -57.93 | VDDM : 1129.75 | AUX_INT :   -7.25 | CsaBias :   75.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19308e-03 / 2
  ADC_P0  : -7.25149e-03 ± 2.34397e-02
  ADC_P1  : 8.30697e-03 ± 5.82815e-04
  ADC_P2  : -5.14679e-06 ± 2.86867e-06
  CSA_Chi2/NDF : 1.49360e-04 / 2
  CSA_P0  : 5.78143e-02 ± 8.15152e-03
  CSA_P1  : 9.90054e-03 ± 6.14159e-04
  CSA_P2  : -4.99214e-05 ± 9.35291e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [23, 62, 65, 75, 88, 101, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [18, 22, 27, 50, 73, 74, 84, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2030', '1.800', '0.1648', '1.800', '0.0879', '7.000', '0.7082', 1, 1, 1, 1, 1724895184.0958316]
VI_after__Init : ['1.201', '0.2029', '1.800', '0.1637', '1.800', '0.0795', '7.000', '0.7071', 1, 1, 1, 1, 1724895192.1962545]
VI_at__the_End : ['1.201', '0.4798', '1.800', '0.1348', '1.800', '0.1106', '7.000', '0.7080', 1, 1, 1, 1, 1724895247.7739625]