TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_36_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-021-10 | FUSED_ID : 6359364768388677978
  IC_TEMP :  -54.85 | VDDM : 1120.91 | AUX_INT :   -7.73 | CsaBias :   79.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11797e-03 / 2
  ADC_P0  : -7.73131e-03 ± 2.26801e-02
  ADC_P1  : 8.01702e-03 ± 5.43105e-04
  ADC_P2  : -4.74503e-06 ± 2.58264e-06
  CSA_Chi2/NDF : 9.63877e-05 / 2
  CSA_P0  : 5.81878e-02 ± 6.54837e-03
  CSA_P1  : 9.22877e-03 ± 4.93372e-04
  CSA_P2  : -3.84369e-05 ± 7.51348e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [29, 47, 55, 71]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 25, 28, 62, 84, 107, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1855', '1.800', '0.1444', '1.800', '0.0831', '7.000', '0.7082', 1, 1, 1, 1, 1724895376.2832217]
VI_after__Init : ['1.202', '0.1856', '1.800', '0.1443', '1.800', '0.0758', '7.000', '0.7073', 1, 1, 1, 1, 1724895384.3765495]
VI_at__the_End : ['1.201', '0.4825', '1.800', '0.1354', '1.800', '0.1114', '7.000', '0.7079', 1, 1, 1, 1, 1724895448.5887008]