TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_39_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-016-023-10 | FUSED_ID : 6359364768388678010
  IC_TEMP :  -52.21 | VDDM : 1129.76 | AUX_INT :   -6.45 | CsaBias :   83.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.10185e-04 / 2
  ADC_P0  : -6.45418e-03 ± 1.92514e-02
  ADC_P1  : 8.24755e-03 ± 4.68803e-04
  ADC_P2  : -5.64642e-06 ± 2.25259e-06
  CSA_Chi2/NDF : 7.16355e-05 / 2
  CSA_P0  : 5.75432e-02 ± 5.64529e-03
  CSA_P1  : 9.09175e-03 ± 4.25332e-04
  CSA_P2  : -3.34177e-05 ± 6.47731e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [29, 40, 45, 50, 69, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [19, 27, 72, 92, 94, 112, 121, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3415', '1.800', '0.1064', '1.800', '0.0957', '7.000', '0.7077', 1, 1, 1, 1, 1724895568.0134716]
VI_after__Init : ['1.201', '0.3417', '1.800', '0.1064', '1.800', '0.0899', '7.000', '0.7073', 1, 1, 1, 1, 1724895576.7778032]
VI_at__the_End : ['1.201', '0.4948', '1.800', '0.1357', '1.800', '0.1091', '7.000', '0.7083', 1, 1, 1, 1, 1724895631.815614]