TEST_NAME : Wafer
TEST_DATE : 24_08_29-04_05_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-017-007-00 | FUSED_ID : 6359364768388681840
  IC_TEMP :  -61.08 | VDDM : 1212.58 | AUX_INT : -960.01 | CsaBias : -712.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.76582e-02 / 2
  ADC_P0  : -9.60011e-01 ± 4.18503e-01
  ADC_P1  : 2.31327e-02 ± 8.09763e-03
  ADC_P2  : -5.73928e-05 ± 3.24953e-05
  CSA_Chi2/NDF : 1.05486e-04 / 2
  CSA_P0  : 5.55979e-02 ± 6.85047e-03
  CSA_P1  : 9.64498e-03 ± 5.16134e-04
  CSA_P2  : -4.22271e-05 ± 7.86010e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 28, 41, 85, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 50, 52, 59, 87, 106, 108, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1444', '1.800', '0.1397', '1.799', '0.0849', '7.000', '0.7077', 1, 1, 1, 1, 1724897105.5143502]
VI_after__Init : ['1.201', '0.1444', '1.800', '0.1396', '1.800', '0.0792', '7.000', '0.7075', 1, 1, 1, 1, 1724897114.2126498]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1362', '1.803', '0.1100', '7.000', '0.7085', 1, 1, 1, 1, 1724897175.4028754]