TEST_NAME : Wafer
TEST_DATE : 24_08_29-04_03_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-017-008-00 | FUSED_ID : 6359364768388681856
  IC_TEMP :  -49.94 | VDDM : 1123.75 | AUX_INT :  -10.40 | CsaBias :   73.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83543e-03 / 2
  ADC_P0  : -1.04027e-02 ± 2.90708e-02
  ADC_P1  : 8.40149e-03 ± 7.07630e-04
  ADC_P2  : -5.89772e-06 ± 3.43249e-06
  CSA_Chi2/NDF : 1.12264e-04 / 2
  CSA_P0  : 5.48378e-02 ± 7.06711e-03
  CSA_P1  : 9.26169e-03 ± 5.32456e-04
  CSA_P2  : -3.99573e-05 ± 8.10867e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 26, 48, 78, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [6, 17, 20, 22, 40, 58, 96, 120, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3275', '1.800', '0.1256', '1.800', '0.0874', '7.000', '0.7079', 1, 1, 1, 1, 1724897010.5036428]
VI_after__Init : ['1.201', '0.3273', '1.800', '0.1257', '1.801', '0.0821', '7.000', '0.7076', 1, 1, 1, 1, 1724897018.698958]
VI_at__the_End : ['1.201', '0.4746', '1.800', '0.1337', '1.801', '0.1102', '7.000', '0.7084', 1, 1, 1, 1, 1724897074.0946558]