TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_58_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-017-011-00 | FUSED_ID : 6359364768388681904
  IC_TEMP :  -50.26 | VDDM : 1129.26 | AUX_INT :   -7.99 | CsaBias :   79.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30734e-03 / 2
  ADC_P0  : -7.99057e-03 ± 2.45614e-02
  ADC_P1  : 8.04109e-03 ± 5.93227e-04
  ADC_P2  : -4.54182e-06 ± 2.84677e-06
  CSA_Chi2/NDF : 9.92198e-05 / 2
  CSA_P0  : 5.65691e-02 ± 6.64388e-03
  CSA_P1  : 9.41875e-03 ± 5.00568e-04
  CSA_P2  : -3.96700e-05 ± 7.62306e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 28, 67, 83, 111, 116, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [13, 35, 54, 60, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1667', '1.800', '0.1181', '1.800', '0.0805', '7.000', '0.7079', 1, 1, 1, 1, 1724896721.9947565]
VI_after__Init : ['1.202', '0.1667', '1.800', '0.1179', '1.799', '0.0747', '7.000', '0.7076', 1, 1, 1, 1, 1724896730.8710935]
VI_at__the_End : ['1.201', '0.4890', '1.800', '0.1348', '1.801', '0.1092', '7.000', '0.7087', 1, 1, 1, 1, 1724896793.6152115]