TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_57_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-017-012-00 | FUSED_ID : 6359364768388681920
  IC_TEMP :  -50.26 | VDDM : 1131.61 | AUX_INT :   -7.96 | CsaBias :   80.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23313e-03 / 2
  ADC_P0  : -7.96132e-03 ± 2.37882e-02
  ADC_P1  : 8.08351e-03 ± 5.63095e-04
  ADC_P2  : -5.51292e-06 ± 2.63688e-06
  CSA_Chi2/NDF : 9.25628e-05 / 2
  CSA_P0  : 5.70745e-02 ± 6.41713e-03
  CSA_P1  : 9.38265e-03 ± 4.83484e-04
  CSA_P2  : -3.94300e-05 ± 7.36289e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [33, 34, 68, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [8, 16, 22, 54, 62, 84, 91, 102, 104, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0572', '1.800', '0.1486', '1.799', '0.0842', '7.000', '0.7079', 1, 1, 1, 1, 1724896626.0010507]
VI_after__Init : ['1.202', '0.0572', '1.800', '0.1485', '1.800', '0.0786', '7.000', '0.7077', 1, 1, 1, 1, 1724896634.0894778]
VI_at__the_End : ['1.202', '0.4871', '1.800', '0.1337', '1.800', '0.1095', '7.000', '0.7084', 1, 1, 1, 1, 1724896685.753551]