TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_52_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-017-015-00 | FUSED_ID : 6359364768388681968
  IC_TEMP :  -58.73 | VDDM : 1119.80 | AUX_INT :  -10.42 | CsaBias :   71.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63974e-03 / 2
  ADC_P0  : -1.04188e-02 ± 2.74358e-02
  ADC_P1  : 8.21771e-03 ± 6.50836e-04
  ADC_P2  : -5.70521e-06 ± 3.08333e-06
  CSA_Chi2/NDF : 1.59794e-04 / 2
  CSA_P0  : 5.97975e-02 ± 8.43146e-03
  CSA_P1  : 1.00962e-02 ± 6.35249e-04
  CSA_P2  : -5.14747e-05 ± 9.67410e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [3, 7, 9, 23, 24, 73, 80, 87, 89, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [7, 9, 23, 25, 61, 67, 74, 76, 103, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.0855', '1.800', '0.1217', '1.800', '0.0822', '7.000', '0.7078', 1, 1, 1, 1, 1724896337.6911492]
VI_after__Init : ['1.201', '0.0855', '1.800', '0.1213', '1.800', '0.0765', '7.000', '0.7078', 1, 1, 1, 1, 1724896346.0107167]
VI_at__the_End : ['1.201', '0.4871', '1.800', '0.1370', '1.803', '0.1133', '7.000', '0.7084', 1, 1, 1, 1, 1724896406.2740307]