TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_50_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-017-016-07 | FUSED_ID : 6359364768388681991
  IC_TEMP :  -51.19 | VDDM : 1128.58 | AUX_INT :   -6.78 | CsaBias :   91.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10327e-03 / 2
  ADC_P0  : -6.77752e-03 ± 2.25641e-02
  ADC_P1  : 8.23942e-03 ± 5.66012e-04
  ADC_P2  : -4.46904e-06 ± 2.81502e-06
  CSA_Chi2/NDF : 9.29972e-05 / 2
  CSA_P0  : 6.09311e-02 ± 6.43217e-03
  CSA_P1  : 9.28880e-03 ± 4.84617e-04
  CSA_P2  : -3.79550e-05 ± 7.38015e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 59, 66, 118, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [26, 44, 55, 86, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2031', '1.800', '0.1298', '1.800', '0.0856', '7.000', '0.7079', 1, 1, 1, 1, 1724896240.4788013]
VI_after__Init : ['1.201', '0.2031', '1.800', '0.1298', '1.800', '0.0799', '7.000', '0.7076', 1, 1, 1, 1, 1724896248.7500553]
VI_at__the_End : ['1.201', '0.4931', '1.800', '0.1377', '1.800', '0.1091', '7.000', '0.7083', 1, 1, 1, 1, 1724896303.2679014]