TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_41_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-017-022-07 | FUSED_ID : 6359364768388682087
  IC_TEMP :  -51.69 | VDDM : 1136.43 | AUX_INT : -108.47 | CsaBias :   14.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.38614e-04 / 2
  ADC_P0  : -1.08472e-01 ± 2.39811e-02
  ADC_P1  : 9.55776e-03 ± 5.54380e-04
  ADC_P2  : -1.03721e-05 ± 2.49466e-06
  CSA_Chi2/NDF : 7.56589e-05 / 2
  CSA_P0  : 5.86581e-02 ± 5.80166e-03
  CSA_P1  : 9.07326e-03 ± 4.37113e-04
  CSA_P2  : -3.30647e-05 ± 6.65672e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [10, 15, 45, 69, 77, 84, 96, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [17, 37, 60, 95, 111, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3927', '1.800', '0.1144', '1.800', '0.0953', '7.000', '0.7075', 1, 1, 1, 1, 1724895664.5120697]
VI_after__Init : ['1.201', '0.3926', '1.800', '0.1145', '1.800', '0.0893', '7.000', '0.7075', 1, 1, 1, 1, 1724895673.4042995]
VI_at__the_End : ['1.201', '0.4982', '1.800', '0.1332', '1.800', '0.1102', '7.000', '0.7084', 1, 1, 1, 1, 1724895727.439182]