TEST_NAME : Wafer
TEST_DATE : 24_08_29-04_09_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-018-011-14 | FUSED_ID : 6359364768388686014
  IC_TEMP :  -47.58 | VDDM : 1128.95 | AUX_INT :   -6.93 | CsaBias :   81.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07840e-03 / 2
  ADC_P0  : -6.93119e-03 ± 2.22995e-02
  ADC_P1  : 8.09906e-03 ± 5.47867e-04
  ADC_P2  : -4.41165e-06 ± 2.66985e-06
  CSA_Chi2/NDF : 1.23634e-04 / 2
  CSA_P0  : 5.80231e-02 ± 7.41635e-03
  CSA_P1  : 9.45247e-03 ± 5.58769e-04
  CSA_P2  : -3.97404e-05 ± 8.50939e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 72, 94, 102, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [5, 32, 42]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1337', '1.800', '0.1453', '1.800', '0.0881', '7.000', '0.7073', 1, 1, 1, 1, 1724897394.6450112]
VI_after__Init : ['1.201', '0.1336', '1.800', '0.1452', '1.800', '0.0824', '7.000', '0.7072', 1, 1, 1, 1, 1724897402.7474892]
VI_at__the_End : ['1.201', '0.4918', '1.800', '0.1364', '1.799', '0.1108', '7.000', '0.7080', 1, 1, 1, 1, 1724897456.709291]