TEST_NAME : Wafer
TEST_DATE : 24_08_29-04_11_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-018-012-14 | FUSED_ID : 6359364768388686030
  IC_TEMP :  -53.40 | VDDM : 1132.07 | AUX_INT :   -7.35 | CsaBias :   75.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.82543e-04 / 2
  ADC_P0  : -7.34839e-03 ± 2.00837e-02
  ADC_P1  : 8.30019e-03 ± 4.88019e-04
  ADC_P2  : -5.85312e-06 ± 2.34708e-06
  CSA_Chi2/NDF : 1.27075e-04 / 2
  CSA_P0  : 5.76617e-02 ± 7.51887e-03
  CSA_P1  : 9.84718e-03 ± 5.66492e-04
  CSA_P2  : -4.41825e-05 ± 8.62701e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [7, 18, 31, 40, 46, 86, 98, 99, 108, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 63, 74, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3775', '1.800', '0.1214', '1.799', '0.0891', '7.000', '0.7073', 1, 1, 1, 1, 1724897490.1937826]
VI_after__Init : ['1.201', '0.3777', '1.800', '0.1213', '1.800', '0.0842', '7.000', '0.7072', 1, 1, 1, 1, 1724897498.242062]
VI_at__the_End : ['1.201', '0.4964', '1.800', '0.1363', '1.804', '0.1102', '7.000', '0.7078', 1, 1, 1, 1, 1724897551.2849941]