TEST_NAME : Wafer
TEST_DATE : 24_08_29-04_14_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-018-014-14 | FUSED_ID : 6359364768388686062
  IC_TEMP :  -65.28 | VDDM : 1116.56 | AUX_INT :   -9.36 | CsaBias :   66.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53531e-03 / 2
  ADC_P0  : -9.35956e-03 ± 2.65780e-02
  ADC_P1  : 8.46735e-03 ± 6.58145e-04
  ADC_P2  : -5.80938e-06 ± 3.24269e-06
  CSA_Chi2/NDF : 1.62705e-04 / 2
  CSA_P0  : 5.85405e-02 ± 8.50790e-03
  CSA_P1  : 9.70823e-03 ± 6.41009e-04
  CSA_P2  : -5.03524e-05 ± 9.76181e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 38, 58, 91, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [3, 18, 29, 30, 43, 45, 84, 86, 89, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2133', '1.800', '0.1652', '1.800', '0.0904', '7.000', '0.7072', 1, 1, 1, 1, 1724897683.5209293]
VI_after__Init : ['1.202', '0.2132', '1.800', '0.1653', '1.801', '0.0845', '7.000', '0.7068', 1, 1, 1, 1, 1724897691.5693111]
VI_at__the_End : ['1.201', '0.4631', '1.800', '0.1352', '1.800', '0.1168', '7.000', '0.7079', 1, 1, 1, 1, 1724897752.884603]