TEST_NAME : Wafer
TEST_DATE : 24_08_29-04_21_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-018-018-09 | FUSED_ID : 6359364768388686121
  IC_TEMP :  -59.33 | VDDM : 1124.62 | AUX_INT :  -10.38 | CsaBias :   76.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.87997e-03 / 2
  ADC_P0  : -1.03820e-02 ± 2.94606e-02
  ADC_P1  : 7.94294e-03 ± 6.86918e-04
  ADC_P2  : -4.80610e-06 ± 3.20147e-06
  CSA_Chi2/NDF : 1.54654e-04 / 2
  CSA_P0  : 5.57221e-02 ± 8.29475e-03
  CSA_P1  : 9.98564e-03 ± 6.24950e-04
  CSA_P2  : -4.89644e-05 ± 9.51724e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [12, 46, 107, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [36, 59, 97, 111, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4632', '1.800', '0.1328', '1.800', '0.0990', '7.000', '0.7077', 1, 1, 1, 1, 1724898067.653613]
VI_after__Init : ['1.201', '0.4610', '1.800', '0.1327', '1.800', '0.0922', '7.000', '0.7070', 1, 1, 1, 1, 1724898075.6919985]
VI_at__the_End : ['1.201', '0.4861', '1.800', '0.1345', '1.803', '0.1116', '7.000', '0.7078', 1, 1, 1, 1, 1724898137.4382405]