TEST_NAME : Wafer
TEST_DATE : 24_08_29-04_22_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-018-019-09 | FUSED_ID : 6359364768388686137
  IC_TEMP :  -56.06 | VDDM : 1125.61 | AUX_INT :   -9.68 | CsaBias :   79.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.84704e-03 / 2
  ADC_P0  : -9.68081e-03 ± 2.92449e-02
  ADC_P1  : 8.17221e-03 ± 7.13467e-04
  ADC_P2  : -4.62608e-06 ± 3.47500e-06
  CSA_Chi2/NDF : 1.46092e-04 / 2
  CSA_P0  : 5.74454e-02 ± 8.06185e-03
  CSA_P1  : 9.72902e-03 ± 6.07402e-04
  CSA_P2  : -4.45044e-05 ± 9.25002e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [61, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 8, 39, 49, 67, 77, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1204', '1.800', '0.1526', '1.799', '0.0816', '7.000', '0.7068', 1, 1, 1, 1, 1724898163.1012278]
VI_after__Init : ['1.201', '0.1203', '1.800', '0.1526', '1.800', '0.0757', '7.000', '0.7070', 1, 1, 1, 1, 1724898171.8236148]
VI_at__the_End : ['1.201', '0.4871', '1.800', '0.1358', '1.807', '0.1115', '7.000', '0.7079', 1, 1, 1, 1, 1724898232.8969848]