TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_06_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-002-010-08 | FUSED_ID : 6359364768389669032
  IC_TEMP :  -88.73 | VDDM : 1101.90 | AUX_INT :  -12.64 | CsaBias :   48.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.45541e-03 / 2
  ADC_P0  : -1.26421e-02 ± 3.36559e-02
  ADC_P1  : 8.84943e-03 ± 8.56124e-04
  ADC_P2  : -6.34581e-06 ± 4.38117e-06
  CSA_Chi2/NDF : 1.92087e-04 / 2
  CSA_P0  : 5.79835e-02 ± 9.24424e-03
  CSA_P1  : 1.06546e-02 ± 6.96487e-04
  CSA_P2  : -7.43677e-05 ± 1.06067e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 18, 51, 83, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [1, 23, 42, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4134', '1.800', '0.1303', '1.800', '0.0983', '7.000', '0.7074', 1, 1, 1, 1, 1724911604.0696354]
VI_after__Init : ['1.201', '0.4148', '1.800', '0.1304', '1.799', '0.0922', '7.000', '0.7073', 1, 1, 1, 1, 1724911612.106137]
VI_at__the_End : ['1.201', '0.4308', '1.800', '0.1372', '1.799', '0.1177', '7.000', '0.7083', 1, 1, 1, 1, 1724911671.765462]