TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_08_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-002-011-08 | FUSED_ID : 6359364768389669048
  IC_TEMP :  -73.18 | VDDM : 1114.81 | AUX_INT :  -11.09 | CsaBias :   48.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92151e-03 / 2
  ADC_P0  : -1.10861e-02 ± 2.97519e-02
  ADC_P1  : 8.56570e-03 ± 7.40070e-04
  ADC_P2  : -5.84971e-06 ± 3.68780e-06
  CSA_Chi2/NDF : 2.15129e-04 / 2
  CSA_P0  : 5.55381e-02 ± 9.78299e-03
  CSA_P1  : 1.04333e-02 ± 7.37078e-04
  CSA_P2  : -6.38942e-05 ± 1.12248e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [30, 37, 40, 64, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 8, 14, 16, 29, 42]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3582', '1.800', '0.1485', '1.800', '0.0979', '7.000', '0.7074', 1, 1, 1, 1, 1724911699.5874941]
VI_after__Init : ['1.201', '0.3593', '1.800', '0.1488', '1.799', '0.0917', '7.000', '0.7073', 1, 1, 1, 1, 1724911708.2968574]
VI_at__the_End : ['1.201', '0.4559', '1.800', '0.1349', '1.803', '0.1213', '7.000', '0.7085', 1, 1, 1, 1, 1724911772.8098855]