TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_41_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-003-010-05 | FUSED_ID : 6359364768389673125
  IC_TEMP :  -60.03 | VDDM : 1129.10 | AUX_INT : -123.93 | CsaBias :  -25.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.73159e-04 / 2
  ADC_P0  : -1.23929e-01 ± 2.65207e-02
  ADC_P1  : 9.92756e-03 ± 6.21203e-04
  ADC_P2  : -1.10784e-05 ± 2.85265e-06
  CSA_Chi2/NDF : 1.59413e-04 / 2
  CSA_P0  : 5.65325e-02 ± 8.42141e-03
  CSA_P1  : 9.76837e-03 ± 6.34492e-04
  CSA_P2  : -4.74690e-05 ± 9.66257e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 50, 63, 77, 98, 108, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [101, 104, 107, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3973', '1.800', '0.1244', '1.800', '0.1023', '7.000', '0.7076', 1, 1, 1, 1, 1724913714.2804346]
VI_after__Init : ['1.201', '0.3973', '1.800', '0.1245', '1.802', '0.0966', '7.000', '0.7073', 1, 1, 1, 1, 1724913722.493714]
VI_at__the_End : ['1.201', '0.4807', '1.800', '0.1356', '1.799', '0.1171', '7.000', '0.7082', 1, 1, 1, 1, 1724913785.0039601]