TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_38_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-003-012-05 | FUSED_ID : 6359364768389673157
  IC_TEMP :  -57.91 | VDDM : 1123.81 | AUX_INT :   -9.48 | CsaBias :   64.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52246e-03 / 2
  ADC_P0  : -9.48015e-03 ± 2.64570e-02
  ADC_P1  : 8.31902e-03 ± 6.41801e-04
  ADC_P2  : -5.67885e-06 ± 3.09885e-06
  CSA_Chi2/NDF : 1.76782e-04 / 2
  CSA_P0  : 5.76285e-02 ± 8.86833e-03
  CSA_P1  : 9.82472e-03 ± 6.68165e-04
  CSA_P2  : -4.82290e-05 ± 1.01754e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [7, 39, 56, 57, 92, 107, 121, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [26, 37, 59, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3023', '1.800', '0.1496', '1.799', '0.0886', '7.000', '0.7083', 1, 1, 1, 1, 1724913521.9582818]
VI_after__Init : ['1.201', '0.3029', '1.800', '0.1495', '1.800', '0.0810', '7.000', '0.7074', 1, 1, 1, 1, 1724913530.6906385]
VI_at__the_End : ['1.201', '0.4805', '1.800', '0.1349', '1.801', '0.1163', '7.000', '0.7079', 1, 1, 1, 1, 1724913597.302455]