TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_33_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-003-015-05 | FUSED_ID : 6359364768389673205
  IC_TEMP :  -56.51 | VDDM : 1121.71 | AUX_INT :   -8.01 | CsaBias :   67.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05085e-03 / 2
  ADC_P0  : -8.01141e-03 ± 2.19461e-02
  ADC_P1  : 8.49433e-03 ± 5.48061e-04
  ADC_P2  : -5.81802e-06 ± 2.71744e-06
  CSA_Chi2/NDF : 1.32281e-04 / 2
  CSA_P0  : 5.87540e-02 ± 7.67134e-03
  CSA_P1  : 9.87716e-03 ± 5.77980e-04
  CSA_P2  : -4.97734e-05 ± 8.80195e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [1, 10, 25, 50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [13, 25, 36, 69, 94, 95, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2531', '1.800', '0.1647', '1.800', '0.0868', '7.000', '0.7071', 1, 1, 1, 1, 1724913233.4775348]
VI_after__Init : ['1.201', '0.2531', '1.800', '0.1646', '1.801', '0.0810', '7.000', '0.7069', 1, 1, 1, 1, 1724913242.189886]
VI_at__the_End : ['1.201', '0.4794', '1.800', '0.1361', '1.803', '0.1155', '7.000', '0.7079', 1, 1, 1, 1, 1724913308.5507472]