TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_27_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-003-019-02 | FUSED_ID : 6359364768389673266
  IC_TEMP :  -61.29 | VDDM : 1116.19 | AUX_INT :  -11.38 | CsaBias :   74.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.17615e-03 / 2
  ADC_P0  : -1.13847e-02 ± 3.17093e-02
  ADC_P1  : 8.60690e-03 ± 7.95955e-04
  ADC_P2  : -5.72779e-06 ± 4.00474e-06
  CSA_Chi2/NDF : 1.90585e-04 / 2
  CSA_P0  : 5.99012e-02 ± 9.20803e-03
  CSA_P1  : 1.04834e-02 ± 6.93759e-04
  CSA_P2  : -5.76680e-05 ± 1.05651e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [5, 17, 27, 31, 33, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 33, 39, 66, 86, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4238', '1.800', '0.1311', '1.800', '0.0967', '7.000', '0.7070', 1, 1, 1, 1, 1724912849.634254]
VI_after__Init : ['1.201', '0.4242', '1.800', '0.1313', '1.800', '0.0907', '7.000', '0.7065', 1, 1, 1, 1, 1724912857.6966095]
VI_at__the_End : ['1.201', '0.4866', '1.800', '0.1366', '1.799', '0.1170', '7.000', '0.7075', 1, 1, 1, 1, 1724912917.2839603]