TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_22_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-003-022-02 | FUSED_ID : 6359364768389673314
  IC_TEMP :  -62.18 | VDDM : 1126.83 | AUX_INT :   -9.39 | CsaBias :   66.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47754e-03 / 2
  ADC_P0  : -9.39370e-03 ± 2.60813e-02
  ADC_P1  : 8.43953e-03 ± 6.47966e-04
  ADC_P2  : -5.46212e-06 ± 3.21074e-06
  CSA_Chi2/NDF : 2.23457e-04 / 2
  CSA_P0  : 5.73058e-02 ± 9.97054e-03
  CSA_P1  : 1.04061e-02 ± 7.51209e-04
  CSA_P2  : -5.66935e-05 ± 1.14400e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [42, 47, 48, 66, 82, 92, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3062', '1.800', '0.1318', '1.800', '0.0949', '7.000', '0.7072', 1, 1, 1, 1, 1724912560.4006457]
VI_after__Init : ['1.201', '0.3058', '1.800', '0.1318', '1.801', '0.0893', '7.000', '0.7068', 1, 1, 1, 1, 1724912568.551036]
VI_at__the_End : ['1.201', '0.4784', '1.800', '0.1349', '1.813', '0.1163', '7.000', '0.7078', 1, 1, 1, 1, 1724912637.6217742]