TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_53_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-004-009-13 | FUSED_ID : 6359364768389677213
  IC_TEMP :  -54.36 | VDDM : 1128.67 | AUX_INT : -104.40 | CsaBias :    9.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48728e-03 / 2
  ADC_P0  : -1.04395e-01 ± 3.16070e-02
  ADC_P1  : 9.63507e-03 ± 7.48888e-04
  ADC_P2  : -9.72910e-06 ± 3.49948e-06
  CSA_Chi2/NDF : 2.11415e-04 / 2
  CSA_P0  : 6.02158e-02 ± 9.69817e-03
  CSA_P1  : 1.03837e-02 ± 7.30687e-04
  CSA_P2  : -5.44670e-05 ± 1.11275e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 18, 36, 65, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [19, 26, 40, 81, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2866', '1.800', '0.1207', '1.800', '0.0950', '7.000', '0.7076', 1, 1, 1, 1, 1724914387.5956926]
VI_after__Init : ['1.201', '0.2866', '1.800', '0.1206', '1.800', '0.0892', '7.000', '0.7077', 1, 1, 1, 1, 1724914395.6422386]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1394', '1.800', '0.1149', '7.000', '0.7083', 1, 1, 1, 1, 1724914462.2661815]