TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_54_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-004-010-13 | FUSED_ID : 6359364768389677229
  IC_TEMP :  -58.36 | VDDM : 1125.55 | AUX_INT :   -9.08 | CsaBias :   73.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34306e-03 / 2
  ADC_P0  : -9.08385e-03 ± 2.48049e-02
  ADC_P1  : 8.30157e-03 ± 5.94630e-04
  ADC_P2  : -6.06364e-06 ± 2.82923e-06
  CSA_Chi2/NDF : 1.54459e-04 / 2
  CSA_P0  : 5.89897e-02 ± 8.28951e-03
  CSA_P1  : 1.00392e-02 ± 6.24555e-04
  CSA_P2  : -5.02827e-05 ± 9.51124e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 13, 14, 24, 33, 71, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 11, 42, 54, 80, 84, 103, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2055', '1.800', '0.1700', '1.799', '0.0893', '7.000', '0.7078', 1, 1, 1, 1, 1724914483.821618]
VI_after__Init : ['1.201', '0.2057', '1.800', '0.1699', '1.800', '0.0837', '7.000', '0.7081', 1, 1, 1, 1, 1724914491.8669786]
VI_at__the_End : ['1.201', '0.4885', '1.800', '0.1376', '1.800', '0.1143', '7.000', '0.7086', 1, 1, 1, 1, 1724914551.5445435]