TEST_NAME : Wafer
TEST_DATE : 24_08_29-08_59_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-004-013-13 | FUSED_ID : 6359364768389677277
  IC_TEMP :  -53.17 | VDDM : 1128.57 | AUX_INT :   -8.21 | CsaBias :   76.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09773e-03 / 2
  ADC_P0  : -8.20745e-03 ± 2.24302e-02
  ADC_P1  : 8.51507e-03 ± 5.60152e-04
  ADC_P2  : -5.94442e-06 ± 2.77740e-06
  CSA_Chi2/NDF : 1.79380e-04 / 2
  CSA_P0  : 5.78127e-02 ± 8.93324e-03
  CSA_P1  : 1.03074e-02 ± 6.73055e-04
  CSA_P2  : -5.17201e-05 ± 1.02498e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [27, 73, 98, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [0, 5, 9, 14, 21, 38, 63, 83, 93, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1951', '1.800', '0.1821', '1.800', '0.0796', '7.000', '0.7079', 1, 1, 1, 1, 1724914772.029976]
VI_after__Init : ['1.201', '0.1952', '1.800', '0.1819', '1.800', '0.0742', '7.000', '0.7079', 1, 1, 1, 1, 1724914780.8412454]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1373', '1.804', '0.1118', '7.000', '0.7088', 1, 1, 1, 1, 1724914840.3937259]