TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_01_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-004-014-13 | FUSED_ID : 6359364768389677293
  IC_TEMP :  -55.07 | VDDM : 1127.60 | AUX_INT :   -9.62 | CsaBias :   72.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51305e-03 / 2
  ADC_P0  : -9.62246e-03 ± 2.63831e-02
  ADC_P1  : 8.30530e-03 ± 6.42065e-04
  ADC_P2  : -5.41839e-06 ± 3.11743e-06
  CSA_Chi2/NDF : 1.57446e-04 / 2
  CSA_P0  : 5.89074e-02 ± 8.36927e-03
  CSA_P1  : 1.02135e-02 ± 6.30564e-04
  CSA_P2  : -5.14069e-05 ± 9.60274e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 10, 18, 46, 48, 87, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [69, 95, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4775', '1.800', '0.1412', '1.800', '0.0972', '7.000', '0.7080', 1, 1, 1, 1, 1724914868.941684]
VI_after__Init : ['1.201', '0.4775', '1.800', '0.1415', '1.800', '0.0915', '7.000', '0.7079', 1, 1, 1, 1, 1724914876.953963]
VI_at__the_End : ['1.201', '0.4938', '1.800', '0.1381', '1.803', '0.1132', '7.000', '0.7086', 1, 1, 1, 1, 1724914938.236371]