TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_07_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-004-018-10 | FUSED_ID : 6359364768389677354
  IC_TEMP :  -54.74 | VDDM : 1126.58 | AUX_INT :   -8.39 | CsaBias :   75.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28354e-03 / 2
  ADC_P0  : -8.38733e-03 ± 2.42754e-02
  ADC_P1  : 8.40240e-03 ± 5.97111e-04
  ADC_P2  : -5.86791e-06 ± 2.91181e-06
  CSA_Chi2/NDF : 1.34578e-04 / 2
  CSA_P0  : 5.68476e-02 ± 7.73765e-03
  CSA_P1  : 9.90752e-03 ± 5.82976e-04
  CSA_P2  : -4.85812e-05 ± 8.87803e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [36, 46, 51, 55, 63, 74, 108, 111, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 21, 39, 51, 85, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4272', '1.800', '0.1495', '1.800', '0.0968', '7.000', '0.7083', 1, 1, 1, 1, 1724915254.1933064]
VI_after__Init : ['1.201', '0.4276', '1.800', '0.1496', '1.800', '0.0895', '7.000', '0.7077', 1, 1, 1, 1, 1724915262.185777]
VI_at__the_End : ['1.201', '0.4842', '1.800', '0.1345', '1.800', '0.1131', '7.000', '0.7081', 1, 1, 1, 1, 1724915329.294681]