TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_13_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-004-022-10 | FUSED_ID : 6359364768389677418
  IC_TEMP :  -59.22 | VDDM : 1125.92 | AUX_INT :   -7.38 | CsaBias :   59.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01460e-03 / 2
  ADC_P0  : -7.37515e-03 ± 2.15740e-02
  ADC_P1  : 8.46712e-03 ± 5.39959e-04
  ADC_P2  : -5.77923e-06 ± 2.67473e-06
  CSA_Chi2/NDF : 1.91639e-04 / 2
  CSA_P0  : 5.74754e-02 ± 9.23345e-03
  CSA_P1  : 1.06186e-02 ± 6.95674e-04
  CSA_P2  : -5.88153e-05 ± 1.05943e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 17, 40, 41, 58, 104, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [2, 11, 63, 93, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2590', '1.800', '0.1736', '1.799', '0.0974', '7.000', '0.7080', 1, 1, 1, 1, 1724915638.92918]
VI_after__Init : ['1.201', '0.2589', '1.800', '0.1735', '1.800', '0.0898', '7.000', '0.7072', 1, 1, 1, 1, 1724915646.9435945]
VI_at__the_End : ['1.201', '0.4911', '1.800', '0.1384', '1.801', '0.1133', '7.000', '0.7079', 1, 1, 1, 1, 1724915711.9456038]