TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_50_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-004-00 | FUSED_ID : 6359364768389681216
  IC_TEMP :  -67.11 | VDDM : 1115.85 | AUX_INT :   -8.32 | CsaBias :   60.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13901e-03 / 2
  ADC_P0  : -8.31934e-03 ± 2.28307e-02
  ADC_P1  : 8.71500e-03 ± 5.77176e-04
  ADC_P2  : -6.63538e-06 ± 2.89099e-06
  CSA_Chi2/NDF : 2.06032e-04 / 2
  CSA_P0  : 5.61046e-02 ± 9.57393e-03
  CSA_P1  : 1.00449e-02 ± 7.21326e-04
  CSA_P2  : -5.32331e-05 ± 1.09849e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [26, 59, 100, 101, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 15, 71, 84, 103, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2286', '1.800', '0.1195', '1.800', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1724917844.3940158]
VI_after__Init : ['1.201', '0.2289', '1.800', '0.1196', '1.800', '0.0877', '7.000', '0.7078', 1, 1, 1, 1, 1724917852.465442]
VI_at__the_End : ['1.201', '0.4708', '1.800', '0.1373', '1.804', '0.1195', '7.000', '0.7086', 1, 1, 1, 1, 1724917912.2738183]