TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_41_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-010-00 | FUSED_ID : 6359364768389681312
  IC_TEMP :  -59.32 | VDDM : 1122.02 | AUX_INT :   -7.94 | CsaBias :   66.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12314e-03 / 2
  ADC_P0  : -7.94280e-03 ± 2.27392e-02
  ADC_P1  : 8.30868e-03 ± 5.66111e-04
  ADC_P2  : -4.86610e-06 ± 2.80523e-06
  CSA_Chi2/NDF : 2.02944e-04 / 2
  CSA_P0  : 5.80245e-02 ± 9.50190e-03
  CSA_P1  : 1.04070e-02 ± 7.15900e-04
  CSA_P2  : -5.89621e-05 ± 1.09023e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [24, 37, 66, 77, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [35, 39, 41, 43]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4116', '1.800', '0.1528', '1.799', '0.0961', '7.000', '0.7079', 1, 1, 1, 1, 1724917268.5090456]
VI_after__Init : ['1.202', '0.4120', '1.800', '0.1530', '1.800', '0.0901', '7.000', '0.7076', 1, 1, 1, 1, 1724917276.6964931]
VI_at__the_End : ['1.202', '0.4778', '1.800', '0.1392', '1.799', '0.1154', '7.000', '0.7084', 1, 1, 1, 1, 1724917344.2123342]