TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_39_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-011-00 | FUSED_ID : 6359364768389681328
  IC_TEMP :  -53.06 | VDDM : 1122.86 | AUX_INT :   -8.49 | CsaBias :   73.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10867e-03 / 2
  ADC_P0  : -8.48568e-03 ± 2.25269e-02
  ADC_P1  : 8.22063e-03 ± 5.39909e-04
  ADC_P2  : -5.67666e-06 ± 2.57128e-06
  CSA_Chi2/NDF : 1.36240e-04 / 2
  CSA_P0  : 5.96027e-02 ± 7.78529e-03
  CSA_P1  : 9.72344e-03 ± 5.86566e-04
  CSA_P2  : -4.57488e-05 ± 8.93270e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [12, 16, 24, 34, 62, 79, 121, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 18, 23, 50, 61, 94, 99, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4529', '1.800', '0.1622', '1.799', '0.0962', '7.000', '0.7075', 1, 1, 1, 1, 1724917171.66555]
VI_after__Init : ['1.201', '0.4536', '1.800', '0.1624', '1.801', '0.0908', '7.000', '0.7076', 1, 1, 1, 1, 1724917179.774885]
VI_at__the_End : ['1.202', '0.4864', '1.800', '0.1377', '1.800', '0.1113', '7.000', '0.7084', 1, 1, 1, 1, 1724917246.7297618]