TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_33_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-015-00 | FUSED_ID : 6359364768389681392
  IC_TEMP :  -55.46 | VDDM : 1131.39 | AUX_INT :   -7.64 | CsaBias :   69.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22518e-03 / 2
  ADC_P0  : -7.64401e-03 ± 2.37606e-02
  ADC_P1  : 8.64203e-03 ± 6.15158e-04
  ADC_P2  : -5.42518e-06 ± 3.15989e-06
  CSA_Chi2/NDF : 1.61912e-04 / 2
  CSA_P0  : 6.05618e-02 ± 8.48714e-03
  CSA_P1  : 1.05106e-02 ± 6.39445e-04
  CSA_P2  : -5.62676e-05 ± 9.73799e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 19, 61, 81, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [59, 70, 100, 105, 123, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2561', '1.800', '0.1863', '1.800', '0.0903', '7.000', '0.7073', 1, 1, 1, 1, 1724916793.4766057]
VI_after__Init : ['1.202', '0.2565', '1.800', '0.1864', '1.800', '0.0846', '7.000', '0.7072', 1, 1, 1, 1, 1724916801.709884]
VI_at__the_End : ['1.201', '0.4975', '1.800', '0.1417', '1.800', '0.1124', '7.000', '0.7078', 1, 1, 1, 1, 1724916868.707782]