TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_30_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-017-07 | FUSED_ID : 6359364768389681431
  IC_TEMP :  -58.49 | VDDM : 1126.14 | AUX_INT :   -8.25 | CsaBias :   68.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30088e-03 / 2
  ADC_P0  : -8.25387e-03 ± 2.44476e-02
  ADC_P1  : 8.55435e-03 ± 6.14021e-04
  ADC_P2  : -6.01049e-06 ± 3.05603e-06
  CSA_Chi2/NDF : 1.16208e-04 / 2
  CSA_P0  : 5.86577e-02 ± 7.19018e-03
  CSA_P1  : 9.50767e-03 ± 5.41728e-04
  CSA_P2  : -4.49104e-05 ± 8.24988e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 8, 12, 14, 18, 66]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [14, 29, 59, 79, 87, 92, 102, 126, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3655', '1.800', '0.1930', '1.800', '0.0933', '7.000', '0.7071', 1, 1, 1, 1, 1724916601.9412355]
VI_after__Init : ['1.202', '0.3657', '1.800', '0.1930', '1.801', '0.0877', '7.000', '0.7073', 1, 1, 1, 1, 1724916609.9896185]
VI_at__the_End : ['1.201', '0.4756', '1.800', '0.1374', '1.806', '0.1138', '7.000', '0.7078', 1, 1, 1, 1, 1724916676.4835634]