TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_28_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-018-07 | FUSED_ID : 6359364768389681447
  IC_TEMP :  -59.79 | VDDM : 1120.53 | AUX_INT :   -9.70 | CsaBias :   59.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45031e-03 / 2
  ADC_P0  : -9.69777e-03 ± 2.57820e-02
  ADC_P1  : 8.64543e-03 ± 6.42528e-04
  ADC_P2  : -6.50901e-06 ± 3.18556e-06
  CSA_Chi2/NDF : 1.55682e-04 / 2
  CSA_P0  : 5.92119e-02 ± 8.32227e-03
  CSA_P1  : 1.03634e-02 ± 6.27023e-04
  CSA_P2  : -5.68445e-05 ± 9.54882e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 75, 112, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 9, 49, 76, 97, 107, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4407', '1.800', '0.1210', '1.799', '0.0986', '7.000', '0.7069', 1, 1, 1, 1, 1724916505.1987307]
VI_after__Init : ['1.202', '0.4411', '1.800', '0.1213', '1.800', '0.0930', '7.000', '0.7071', 1, 1, 1, 1, 1724916513.2331157]
VI_at__the_End : ['1.202', '0.4821', '1.800', '0.1382', '1.799', '0.1166', '7.000', '0.7078', 1, 1, 1, 1, 1724916581.6598866]