TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_26_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-019-07 | FUSED_ID : 6359364768389681463
  IC_TEMP :  -58.23 | VDDM : 1103.66 | AUX_INT :  -10.92 | CsaBias :   67.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.96518e-03 / 2
  ADC_P0  : -1.09214e-02 ± 3.00902e-02
  ADC_P1  : 8.74962e-03 ± 7.61932e-04
  ADC_P2  : -6.34128e-06 ± 3.85439e-06
  CSA_Chi2/NDF : 1.75377e-04 / 2
  CSA_P0  : 5.88881e-02 ± 8.83302e-03
  CSA_P1  : 1.02832e-02 ± 6.65504e-04
  CSA_P2  : -5.31793e-05 ± 1.01348e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [3, 11, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [41, 45, 66, 102, 107, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4995', '1.800', '0.1456', '1.800', '0.1002', '7.000', '0.7071', 1, 1, 1, 1, 1724916408.4491663]
VI_after__Init : ['1.201', '0.4999', '1.800', '0.1461', '1.799', '0.0943', '7.000', '0.7071', 1, 1, 1, 1, 1724916417.2445414]
VI_at__the_End : ['1.201', '0.4909', '1.800', '0.1392', '1.799', '0.1131', '7.000', '0.7079', 1, 1, 1, 1, 1724916482.245505]