TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_25_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-005-020-07 | FUSED_ID : 6359364768389681479
  IC_TEMP :  -57.51 | VDDM : 1117.88 | AUX_INT :   -9.06 | CsaBias :   70.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25633e-03 / 2
  ADC_P0  : -9.06225e-03 ± 2.39746e-02
  ADC_P1  : 8.93157e-03 ± 6.17787e-04
  ADC_P2  : -7.00969e-06 ± 3.16293e-06
  CSA_Chi2/NDF : 1.56167e-04 / 2
  CSA_P0  : 5.89997e-02 ± 8.33522e-03
  CSA_P1  : 1.03622e-02 ± 6.27999e-04
  CSA_P2  : -5.35401e-05 ± 9.56368e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [36, 79, 81, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [43, 49, 50, 56, 57, 77]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2566', '1.800', '0.1540', '1.800', '0.0863', '7.000', '0.7070', 1, 1, 1, 1, 1724916312.7025583]
VI_after__Init : ['1.201', '0.2568', '1.800', '0.1540', '1.801', '0.0805', '7.000', '0.7068', 1, 1, 1, 1, 1724916320.9889648]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1397', '1.800', '0.1136', '7.000', '0.7078', 1, 1, 1, 1, 1724916389.010691]