TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_53_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-006-004-14 | FUSED_ID : 6359364768389685326
  IC_TEMP :  -61.60 | VDDM : 1203.05 | AUX_INT : -1121.47 | CsaBias : -824.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.68480e-02 / 2
  ADC_P0  : -1.12147e+00 ± 5.26649e-01
  ADC_P1  : 2.55388e-02 ± 1.00138e-02
  ADC_P2  : -6.55693e-05 ± 3.99581e-05
  CSA_Chi2/NDF : 1.84000e-04 / 2
  CSA_P0  : 5.77535e-02 ± 9.04755e-03
  CSA_P1  : 1.01450e-02 ± 6.81668e-04
  CSA_P2  : -4.94411e-05 ± 1.03810e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [26, 79, 91, 118, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [23, 59, 62, 79, 94, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0350', '1.800', '0.0782', '1.799', '0.0792', '7.000', '0.7084', 1, 1, 1, 1, 1724918030.584642]
VI_after__Init : ['1.202', '0.0350', '1.800', '0.0782', '1.799', '0.0718', '7.000', '0.7078', 1, 1, 1, 1, 1724918038.6281126]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1417', '1.801', '0.1152', '7.000', '0.7087', 1, 1, 1, 1, 1724918095.320828]