TEST_NAME : Wafer
TEST_DATE : 24_08_29-09_55_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-006-005-14 | FUSED_ID : 6359364768389685342
  IC_TEMP :  -52.04 | VDDM : 1211.62 | AUX_INT : -1108.45 | CsaBias : -774.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.25396e-02 / 2
  ADC_P0  : -1.10845e+00 ± 5.39255e-01
  ADC_P1  : 2.46979e-02 ± 9.89827e-03
  ADC_P2  : -6.15382e-05 ± 3.80674e-05
  CSA_Chi2/NDF : 1.52414e-04 / 2
  CSA_P0  : 5.79146e-02 ± 8.23445e-03
  CSA_P1  : 9.86029e-03 ± 6.20406e-04
  CSA_P2  : -4.51687e-05 ± 9.44805e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 16, 26, 29, 107, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [24, 56, 61, 82, 105, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3082', '1.800', '0.1479', '1.800', '0.0921', '7.000', '0.7087', 1, 1, 1, 1, 1724918126.0574148]
VI_after__Init : ['1.201', '0.3085', '1.800', '0.1479', '1.801', '0.0846', '7.000', '0.7076', 1, 1, 1, 1, 1724918134.8447273]
VI_at__the_End : ['1.202', '0.4966', '1.800', '0.1406', '1.804', '0.1127', '7.000', '0.7088', 1, 1, 1, 1, 1724918191.0171118]