TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_01_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-006-009-14 | FUSED_ID : 6359364768389685406
  IC_TEMP :  -57.23 | VDDM : 1125.79 | AUX_INT :   -9.32 | CsaBias :   76.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26933e-03 / 2
  ADC_P0  : -9.31986e-03 ± 2.40826e-02
  ADC_P1  : 8.60742e-03 ± 5.94794e-04
  ADC_P2  : -6.63914e-06 ± 2.92106e-06
  CSA_Chi2/NDF : 1.46747e-04 / 2
  CSA_P0  : 5.89018e-02 ± 8.07993e-03
  CSA_P1  : 1.03982e-02 ± 6.08765e-04
  CSA_P2  : -5.41005e-05 ± 9.27076e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [46, 51, 57, 93, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 8, 25, 30, 36, 44, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2089', '1.800', '0.1458', '1.800', '0.0854', '7.000', '0.7084', 1, 1, 1, 1, 1724918511.0135193]
VI_after__Init : ['1.202', '0.2090', '1.800', '0.1458', '1.800', '0.0782', '7.000', '0.7079', 1, 1, 1, 1, 1724918519.7997758]
VI_at__the_End : ['1.201', '0.4940', '1.800', '0.1399', '1.810', '0.1137', '7.000', '0.7083', 1, 1, 1, 1, 1724918586.940481]