TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_13_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-006-016-09 | FUSED_ID : 6359364768389685513
  IC_TEMP :  -51.52 | VDDM : 1125.26 | AUX_INT :  -10.00 | CsaBias :   74.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.58120e-03 / 2
  ADC_P0  : -1.00037e-02 ± 2.69604e-02
  ADC_P1  : 8.49068e-03 ± 6.66130e-04
  ADC_P2  : -5.84878e-06 ± 3.28497e-06
  CSA_Chi2/NDF : 1.14912e-04 / 2
  CSA_P0  : 5.96202e-02 ± 7.14998e-03
  CSA_P1  : 9.85280e-03 ± 5.38699e-04
  CSA_P2  : -4.63255e-05 ± 8.20375e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [26, 28, 53, 95, 97, 98, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 2, 14, 27, 35, 41, 44, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1648', '1.800', '0.1882', '1.799', '0.0889', '7.000', '0.7078', 1, 1, 1, 1, 1724919183.6648881]
VI_after__Init : ['1.201', '0.1649', '1.800', '0.1883', '1.800', '0.0817', '7.000', '0.7070', 1, 1, 1, 1, 1724919191.7963536]
VI_at__the_End : ['1.201', '0.4927', '1.800', '0.1396', '1.806', '0.1130', '7.000', '0.7077', 1, 1, 1, 1, 1724919257.6101809]