TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_17_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-006-019-09 | FUSED_ID : 6359364768389685561
  IC_TEMP :  -50.65 | VDDM : 1128.18 | AUX_INT :   -7.84 | CsaBias :   81.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17106e-03 / 2
  ADC_P0  : -7.84476e-03 ± 2.31967e-02
  ADC_P1  : 8.19702e-03 ± 5.62007e-04
  ADC_P2  : -5.32610e-06 ± 2.69867e-06
  CSA_Chi2/NDF : 1.08045e-04 / 2
  CSA_P0  : 5.66918e-02 ± 6.93304e-03
  CSA_P1  : 9.94232e-03 ± 5.22355e-04
  CSA_P2  : -4.59802e-05 ± 7.95484e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [5, 17, 24, 37, 46, 62, 71, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 15, 30, 39, 50, 56, 91, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2879', '1.800', '0.1956', '1.800', '0.0964', '7.000', '0.7076', 1, 1, 1, 1, 1724919471.5076697]
VI_after__Init : ['1.202', '0.2880', '1.799', '0.1956', '1.800', '0.0890', '7.000', '0.7069', 1, 1, 1, 1, 1724919480.2220478]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1362', '1.804', '0.1114', '7.000', '0.7075', 1, 1, 1, 1, 1724919538.8424554]