TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_22_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-006-022-09 | FUSED_ID : 6359364768389685609
  IC_TEMP :  -52.32 | VDDM : 1131.34 | AUX_INT :   -5.85 | CsaBias :   68.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.34705e-04 / 2
  ADC_P0  : -5.85355e-03 ± 1.95620e-02
  ADC_P1  : 8.36080e-03 ± 4.88952e-04
  ADC_P2  : -5.49492e-06 ± 2.40824e-06
  CSA_Chi2/NDF : 1.40768e-04 / 2
  CSA_P0  : 5.82807e-02 ± 7.91359e-03
  CSA_P1  : 1.00646e-02 ± 5.96232e-04
  CSA_P2  : -4.74603e-05 ± 9.07991e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [58, 75, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [62, 75, 93, 95, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2498', '1.800', '0.1540', '1.799', '0.0843', '7.000', '0.7068', 1, 1, 1, 1, 1724919760.3063138]
VI_after__Init : ['1.201', '0.2495', '1.800', '0.1539', '1.800', '0.0790', '7.000', '0.7067', 1, 1, 1, 1, 1724919768.3586974]
VI_at__the_End : ['1.201', '0.5008', '1.800', '0.1380', '1.800', '0.1107', '7.000', '0.7078', 1, 1, 1, 1, 1724919835.4315853]