TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_25_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-006-024-09 | FUSED_ID : 6359364768389685641
  IC_TEMP :  -52.79 | VDDM : 1131.12 | AUX_INT :   -7.82 | CsaBias :   73.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01210e-03 / 2
  ADC_P0  : -7.81801e-03 ± 2.15394e-02
  ADC_P1  : 8.16638e-03 ± 5.19013e-04
  ADC_P2  : -5.28006e-06 ± 2.48317e-06
  CSA_Chi2/NDF : 1.52515e-04 / 2
  CSA_P0  : 5.67651e-02 ± 8.23719e-03
  CSA_P1  : 9.92603e-03 ± 6.20613e-04
  CSA_P2  : -4.73805e-05 ± 9.45120e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 32, 47, 64, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [44, 64, 111, 115, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2435', '1.800', '0.1289', '1.799', '0.0884', '7.000', '0.7080', 1, 1, 1, 1, 1724919952.922576]
VI_after__Init : ['1.201', '0.2435', '1.800', '0.1289', '1.800', '0.0807', '7.000', '0.7071', 1, 1, 1, 1, 1724919961.022011]
VI_at__the_End : ['1.201', '0.4929', '1.800', '0.1346', '1.799', '0.1105', '7.000', '0.7079', 1, 1, 1, 1, 1724920029.653653]