TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_07_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-003-03 | FUSED_ID : 6359364768389689395
  IC_TEMP :  -50.63 | VDDM : 1120.26 | AUX_INT :  -10.44 | CsaBias :   65.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83921e-03 / 2
  ADC_P0  : -1.04392e-02 ± 2.91205e-02
  ADC_P1  : 8.53816e-03 ± 7.26000e-04
  ADC_P2  : -5.75713e-06 ± 3.61448e-06
  CSA_Chi2/NDF : 1.42404e-04 / 2
  CSA_P0  : 5.70941e-02 ± 7.95946e-03
  CSA_P1  : 9.76327e-03 ± 5.99688e-04
  CSA_P2  : -4.49663e-05 ± 9.13254e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 26, 35, 37, 39, 40, 46, 64, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [51, 82, 86, 97, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3302', '1.800', '0.1533', '1.799', '0.0989', '7.000', '0.7070', 1, 1, 1, 1, 1724922450.4827843]
VI_after__Init : ['1.202', '0.3300', '1.800', '0.1532', '1.800', '0.0930', '7.000', '0.7069', 1, 1, 1, 1, 1724922459.3171196]
VI_at__the_End : ['1.202', '0.4901', '1.800', '0.1367', '1.802', '0.1144', '7.000', '0.7077', 1, 1, 1, 1, 1724922526.3222585]